Characterisation of Analog Macromodels under Fault Conditions using a Probabilistic Neural Network


Zwolinski, M. and Tan, C.H. (1999) Characterisation of Analog Macromodels under Fault Conditions using a Probabilistic Neural Network. UNSPECIFIED , 157-60.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: 5th IEEE International Mixed Signal Testing Workshop Organisation: IEEE
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > EEE
Item ID: 251858
Date Deposited: 30 Mar 2000
Last Modified: 02 Mar 2012 14:02
Contributors: Zwolinski, M. (Author)
Tan, C.H. (Author)
Date: 1999
Additional Information: 5th IEEE International Mixed Signal Testing Workshop Organisation: IEEE
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251858

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