Versatile High-level Synthesis of Self-checking Datapaths Using an On-line Testability Metric


(2003) Versatile High-level Synthesis of Self-checking Datapaths Using an On-line Testability Metric. Design Automation and Test in Europe Conference and Exhibition, Munich, Germany, 03 - 07 Mar 2003. IEEE Computer Society.

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Description/Abstract

There have been several recent attempts to include duplication-based on-line testability in behaviourally synthesized designs. In this paper, on-line testability is considered within the optimisation process of iterative, cost function-driven high-level synthesis, such that on-line testing resources are inserted automatically without any modification of the source HDL code. This involves the introduction of a metric for on-line testability. A variation of duplication testing (namely inversion testing) is also used, providing the system with an additional degree of freedom towards minimising hardware overheads associated with test resource insertion. Considering on-line testability within the synthesis process facilitates fast and efficient design space exploration, resulting in a versatile high-level synthesis process, capable of producing alternative realisations according to the designer’s directions.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Event Dates: 3-7 March 2003
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Electronic & Software Systems
Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 256994
Date Deposited: 06 May 2003
Last Modified: 27 Mar 2014 19:59
Publisher: IEEE Computer Society
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/256994

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