Versatile High-level Synthesis of Self-checking Datapaths Using an On-line Testability Metric
(2003) Versatile High-level Synthesis of Self-checking Datapaths Using an On-line Testability Metric. Design Automation and Test in Europe Conference and Exhibition, Munich, Germany, 03 - 07 Mar 2003. IEEE Computer Society.
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Description/Abstract
There have been several recent attempts to include duplication-based on-line testability in behaviourally synthesized designs. In this paper, on-line testability is considered within the optimisation process of iterative, cost function-driven high-level synthesis, such that on-line testing resources are inserted automatically without any modification of the source HDL code. This involves the introduction of a metric for on-line testability. A variation of duplication testing (namely inversion testing) is also used, providing the system with an additional degree of freedom towards minimising hardware overheads associated with test resource insertion. Considering on-line testability within the synthesis process facilitates fast and efficient design space exploration, resulting in a versatile high-level synthesis process, capable of producing alternative realisations according to the designer’s directions.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Event Dates: 3-7 March 2003 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Electronic & Software Systems Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 256994 |
| Date Deposited: | 06 May 2003 |
| Last Modified: | 02 Mar 2012 04:04 |
| Contributors: | Oikonomakos, P (Editor) Zwolinski, M (Editor) Al-Hashimi, B M (Editor) |
| Date: | 2003 |
| Additional Information: | Event Dates: 3-7 March 2003 |
| Status: | Published |
| Publisher: | IEEE Computer Society |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/256994 |
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