Testability Trade-offs for BIST Data Paths
Nicolici, Nicola and Al-Hashimi, Bashir M. (2004) Testability Trade-offs for BIST Data Paths. Journal of Electronic Testing, Theory and Applications (JETTA), 20, Is
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| Item Type: | Article |
|---|---|
| Additional Information: | Commentary On: Journal of Electronic Testing, Theory and Applications (JETTA) |
| ISSNs: | 0923-8174 |
| Keywords: | Low power DFT, BIST |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Electronic & Software Systems |
| Item ID: | 258782 |
| Date Deposited: | 22 Jan 2004 |
| Last Modified: | 02 Mar 2012 12:39 |
| Contributors: | Nicolici, Nicola (Author) Al-Hashimi, Bashir M. (Author) |
| Date: | April 2004 |
| Additional Information: | Commentary On: Journal of Electronic Testing, Theory and Applications (JETTA) |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 0 |
| URI: | http://eprints.soton.ac.uk/id/eprint/258782 |
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