Testability Trade-offs for BIST Data Paths

Nicolici, Nicola and Al-Hashimi, Bashir M. (2004) Testability Trade-offs for BIST Data Paths. Journal of Electronic Testing, 20, Is.

Record type: Article

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Published date: April 2004

Additional Information: Commentary On: Journal of Electronic Testing, Theory and Applications (JETTA)

Keywords: Low power DFT, BIST

Organisations: Electronic & Software Systems

Local EPrints ID: 258782

URI: http://eprints.soton.ac.uk/id/eprint/258782

ISSN: 0923-8174

PURE UUID: 93c7938b-2d2a-4d4a-b356-8f452df98cf3

Date deposited: 22 Jan 2004

Last modified: 14 Mar 2024 06:13

Author: Nicola Nicolici

Author: Bashir M. Al-Hashimi

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