Dynamic Voltage Scaling Aware Delay Fault Testing
Dynamic Voltage Scaling Aware Delay Fault Testing
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faults. This paper analyses the influence of different voltage/frequency settings on fault detection within a DVS application. In particular, the effect of supply voltage on different types of delay faults is considered. This paper presents a study of these problems with simulation results. We have demonstrated that the test application time increases as we reduce the test voltage. We have also shown that for newer technologies we do not have to go to very low voltage levels for delay fault testing. We conclude that it is necessary to test at more than one operating voltage and that the lowest operating voltage does not necessarily give the best fault cover.
Dynamic Voltage Scaling, Delay Fault Testing, Defect Based Testing
Zain Ali, Noohul Basheer
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Zwolinski, Mark
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Al-Hashimi, Bashir M
0b29c671-a6d2-459c-af68-c4614dce3b5d
Harrod, Peter
d461ce2f-df8a-47ec-a380-167fd3f0bb60
2006
Zain Ali, Noohul Basheer
845c9da7-dce4-4965-a7a3-b920e965d82f
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Al-Hashimi, Bashir M
0b29c671-a6d2-459c-af68-c4614dce3b5d
Harrod, Peter
d461ce2f-df8a-47ec-a380-167fd3f0bb60
Zain Ali, Noohul Basheer, Zwolinski, Mark, Al-Hashimi, Bashir M and Harrod, Peter
(2006)
Dynamic Voltage Scaling Aware Delay Fault Testing.
European Test Symposium, Southampton.
21 - 25 May 2006.
Record type:
Conference or Workshop Item
(Paper)
Abstract
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faults. This paper analyses the influence of different voltage/frequency settings on fault detection within a DVS application. In particular, the effect of supply voltage on different types of delay faults is considered. This paper presents a study of these problems with simulation results. We have demonstrated that the test application time increases as we reduce the test voltage. We have also shown that for newer technologies we do not have to go to very low voltage levels for delay fault testing. We conclude that it is necessary to test at more than one operating voltage and that the lowest operating voltage does not necessarily give the best fault cover.
Text
zainalinb_delayfault.pdf
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More information
Published date: 2006
Additional Information:
Event Dates: May 21-25, 2006
Venue - Dates:
European Test Symposium, Southampton, 2006-05-21 - 2006-05-25
Keywords:
Dynamic Voltage Scaling, Delay Fault Testing, Defect Based Testing
Organisations:
Electronic & Software Systems, EEE
Identifiers
Local EPrints ID: 262653
URI: http://eprints.soton.ac.uk/id/eprint/262653
PURE UUID: 2f24460a-2e82-4b0c-887c-bad8dd0360a7
Catalogue record
Date deposited: 30 May 2006
Last modified: 15 Mar 2024 02:39
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Contributors
Author:
Noohul Basheer Zain Ali
Author:
Mark Zwolinski
Author:
Bashir M Al-Hashimi
Author:
Peter Harrod
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