Zhiyuan, He, Peng, Zepo, Eles, Petru, Rosinger, Paul and Al-Hashimi, Bashir M. (2007) Thermal-Aware Soc Test Scheduling with Test Set Partitioning and Interleaving. JETTA.
Record type:
Article
More information
Published date: January 2007
Keywords:
Low-power test, VLSI test
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 263314
URI: http://eprints.soton.ac.uk/id/eprint/263314
PURE UUID: 589afa6a-fe96-46bf-a9c6-17f9d8588cae
Catalogue record
Date deposited: 14 Jan 2007
Last modified: 14 Mar 2024 07:29
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Contributors
Author:
He Zhiyuan
Author:
Zepo Peng
Author:
Petru Eles
Author:
Paul Rosinger
Author:
Bashir M. Al-Hashimi
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