Resistive Bridging Faults DFT with Adaptive Power Management Awareness


Ingelsson, Urban, Rosinger, Paul, Khursheed, S. Saqib, Al-Hashimi, Bashir M. and Harrod, Peter (2007) Resistive Bridging Faults DFT with Adaptive Power Management Awareness. In, 2007 IEEE 16th Asian Test Symposium (ATS’07), Beijing, PR , China, 08 - 11 Oct 2007.

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Description/Abstract

A key design constraint of circuits used in hand-held devices is the power consumption, due mainly to the limitations of battery life. The employment of adaptive power management (APM) methods optimizes the power consumption of such circuits. This paper describes an effective APM-aware DFT technique that consists of a Test Generation Suite, including fault list generation, test pattern generation and fault simulation. The test generation suite is capable of generating test patterns for multiple supply voltage (Vdd) settings to maximize coverage of resistive bridging faults; and a method to reduce the number of Vdd settings without compromising the fault coverage in order to reduce the cost of test. Preliminarily validations of the proposed DFT technique using a number of benchmark circuits demonstrate its effectiveness.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 8-11 October 2007
Keywords: Multi-Vdd Test Generation, Resistive Bridging Fault, Test Point Insertion
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Electronic & Software Systems
ePrint ID: 264203
Date Deposited: 18 Jun 2007
Last Modified: 14 Apr 2014 11:26
Projects:
Reliable Low Power Embedded Computing Systems (ROPEUST)
Funded by: EPSRC (EP/D057663/1)
Led by: Bashir M. Al-Hashimi
1 June 2006 to 30 November 2008
Further Information:Google Scholar
ISI Citation Count:5
URI: http://eprints.soton.ac.uk/id/eprint/264203

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