Resistive Bridging Faults DFT with Adaptive Power Management Awareness

Ingelsson, Urban, Rosinger, Paul, Khursheed, S. Saqib, Al-Hashimi, Bashir M. and Harrod, Peter (2007) Resistive Bridging Faults DFT with Adaptive Power Management Awareness. In, 2007 IEEE 16th Asian Test Symposium (ATS’07), Beijing, PR , China, 08 - 11 Oct 2007.

WarningThere is a more recent version of this item available.


[img] PDF
Download (163Kb)


A key design constraint of circuits used in hand-held devices is the power consumption, due mainly to the limitations of battery life. The employment of adaptive power management (APM) methods optimizes the power consumption of such circuits. This paper describes an effective APM-aware DFT technique that consists of a Test Generation Suite, including fault list generation, test pattern generation and fault simulation. The test generation suite is capable of generating test patterns for multiple supply voltage (Vdd) settings to maximize coverage of resistive bridging faults; and a method to reduce the number of Vdd settings without compromising the fault coverage in order to reduce the cost of test. Preliminarily validations of the proposed DFT technique using a number of benchmark circuits demonstrate its effectiveness.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 8-11 October 2007
Keywords: Multi-Vdd Test Generation, Resistive Bridging Fault, Test Point Insertion
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Electronic & Software Systems
ePrint ID: 264203
Accepted Date and Publication Date:
Date Deposited: 18 Jun 2007
Last Modified: 31 Mar 2016 14:08
Reliable Low Power Embedded Computing Systems (ROPEUST)
Funded by: EPSRC (EP/D057663/1)
Led by: Bashir M. Al-Hashimi
1 June 2006 to 30 November 2008
Further Information:Google Scholar

Available Versions of this Item

Actions (login required)

View Item View Item

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics