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Bridging fault test method with adaptive power management awareness

Khursheed, Saqib, Ingelsson, Urban, Rosinger, Paul, Al-Hashimi, Bashir and Harrod, Peter (2008) Bridging fault test method with adaptive power management awareness IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 27, (6), pp. 1117-1127. (doi:10.1109/TCAD.2008.923247).

Record type: Article


A key design constraint of circuits used in handheld devices is the power consumption, mainly due to battery life limitations. Adaptive power management (APM) techniques aim to increase the battery life of such devices by adjusting the supply voltage and operating frequency, and thus the power consumption, according to the workload. Testing for resistive bridging defects in APM-enabled designs raises a number of challenges due to their complex analog behavior. Testing at more than one supply voltage setting can be employed to improve defect coverage in such systems, however, switching between several supply voltage settings has a detrimental impact on the overall cost of test. This paper proposes a multi-Vdd automatic test generation method which delivers 100% resistive bridging defect coverage and also a way of reducing the number of supply voltage settings required during test through test point insertion. The proposed techniques have been experimentally validated using a number of benchmark circuits.

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Submitted date: 4 January 2008
Published date: June 2008
Keywords: adaptive power management (APM), resistive bridging faults (RBFs), test generation, test points
Organisations: Electronic & Software Systems


Local EPrints ID: 265179
PURE UUID: d1fddb5e-6826-4be3-ae49-9f7b57e00c18

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Date deposited: 14 Feb 2008 18:29
Last modified: 24 Jul 2017 16:41

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Author: Saqib Khursheed
Author: Urban Ingelsson
Author: Paul Rosinger
Author: Peter Harrod

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