Yield Predictive Model Characterization in Analog Circuit Design
Ali, Sawal M, Wilson, Peter R and Brown, Andrew D (2007) Yield Predictive Model Characterization in Analog Circuit Design. At International Synposium on Integrated Circuits 2007,
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| Item Type: | Conference or Workshop Item (Speech) |
|---|---|
| Additional Information: | Event Dates: September 2007 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 264672 |
| Date Deposited: | 11 Oct 2007 |
| Last Modified: | 21 Aug 2012 04:11 |
| Contributors: | Ali, Sawal M (Author) Wilson, Peter R (Author) Brown, Andrew D (Author) |
| Date: | September 2007 |
| Additional Information: | Event Dates: September 2007 |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 0 |
| URI: | http://eprints.soton.ac.uk/id/eprint/264672 |
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