Robust Search Algorithms for Test Pattern Generation


Marques-Silva, Joao and Sakallah, Karem (1997) Robust Search Algorithms for Test Pattern Generation. In, Fault-Tolerant Computing Symposium, Seattle, Washington, USA, IEEE Press, 152-161.

Item Type: Conference or Workshop Item (Paper)
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science
ePrint ID: 265001
Date Deposited: 05 Jan 2008 18:48
Last Modified: 27 Mar 2014 20:09
Publisher: IEEE Press
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/265001

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