Robust Search Algorithms for Test Pattern Generation
Marques-Silva, Joao and Sakallah, Karem (1997) Robust Search Algorithms for Test Pattern Generation. In, Fault-Tolerant Computing Symposium, Seattle, Washington, USA, IEEE Press, 152-161.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science |
| Item ID: | 265001 |
| Date Deposited: | 05 Jan 2008 18:48 |
| Last Modified: | 02 Mar 2012 11:40 |
| Contributors: | Marques-Silva, Joao (Author) Sakallah, Karem (Author) |
| Date: | 1997 |
| Status: | Published |
| Publisher: | IEEE Press |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/265001 |
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