Simulation study of the dependence of submicron polysilicon thin film transistor output characteristics on grain boundary position


Walker, P. , Uno, S. and Mizuta, Hiroshi (2005) Simulation study of the dependence of submicron polysilicon thin film transistor output characteristics on grain boundary position. Japanese Journal of Applied Physics, 44, 8322.

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Item Type: Article
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 266191
Date Deposited: 21 Jul 2008 15:52
Last Modified: 02 Mar 2012 13:42
Contributors: Walker, P. (Author)
Uno, S. (Author)
Mizuta, Hiroshi (Author)
Date: 2005
Status: Published
Further Information:Google Scholar
ISI Citation Count:7
URI: http://eprints.soton.ac.uk/id/eprint/266191

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