Surface Potential Effect on Gate-Drain Avalanche Breakdown in GaAs MESFET's
Mizuta, Hiroshi, Yamaguchi, K. and Takahashi, S. (1987) Surface Potential Effect on Gate-Drain Avalanche Breakdown in GaAs MESFET's. IEEE Transactions on Electron Devices, ED-34, 2027-2033.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 266252 |
| Date Deposited: | 22 Jul 2008 10:56 |
| Last Modified: | 02 Mar 2012 13:21 |
| Contributors: | Mizuta, Hiroshi (Author) Yamaguchi, K. (Author) Takahashi, S. (Author) |
| Date: | 1987 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/266252 |
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