Observation of strongly-coupled multiple-dot characteristics in the dual recess structured silicon channel with different oxidation conditions
Manoharan, M. , Kawata, Y. , Tsuchiya, Yoshishige, Mizuta, Hiroshi and Oda, S. (2007) Observation of strongly-coupled multiple-dot characteristics in the dual recess structured silicon channel with different oxidation conditions. At IEEE Silicon Nanoelectronics Workshop, Kyoto, , pp 151-152.
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| Item Type: | Conference or Workshop Item (Poster) |
|---|---|
| Additional Information: | Event Dates: June 2007 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 266280 |
| Date Deposited: | 23 Jul 2008 09:38 |
| Last Modified: | 02 Mar 2012 13:21 |
| Contributors: | Manoharan, M. (Author) Kawata, Y. (Author) Tsuchiya, Yoshishige (Author) Mizuta, Hiroshi (Author) Oda, S. (Author) |
| Date: | June 2007 |
| Additional Information: | Event Dates: June 2007 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/266280 |
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