Observation of strongly-coupled multiple-dot characteristics in the dual recess structured silicon channel with different oxidation conditions


Manoharan, M. , Kawata, Y. , Tsuchiya, Yoshishige, Mizuta, Hiroshi and Oda, S. (2007) Observation of strongly-coupled multiple-dot characteristics in the dual recess structured silicon channel with different oxidation conditions. At IEEE Silicon Nanoelectronics Workshop, Kyoto, , pp 151-152.

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Item Type: Conference or Workshop Item (Poster)
Additional Information: Event Dates: June 2007
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266280
Date Deposited: 23 Jul 2008 09:38
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266280

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