Manoharan, M., Kawata, Y., Tsuchiya, Yoshishige, Mizuta, Hiroshi and Oda, S. (2007) Observation of strongly-coupled multiple-dot characteristics in the dual recess structured silicon channel with different oxidation conditions. IEEE Silicon Nanoelectronics Workshop, Kyoto. pp 151-152 .
Record type:
Conference or Workshop Item
(Poster)
More information
Published date: June 2007
Additional Information:
Event Dates: June 2007
Venue - Dates:
IEEE Silicon Nanoelectronics Workshop, Kyoto, 2007-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266280
URI: http://eprints.soton.ac.uk/id/eprint/266280
PURE UUID: 4f39f175-04f5-4d02-8103-5fa9e5c2748e
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Date deposited: 23 Jul 2008 09:38
Last modified: 14 Mar 2024 08:24
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Contributors
Author:
M. Manoharan
Author:
Y. Kawata
Author:
Yoshishige Tsuchiya
Author:
Hiroshi Mizuta
Author:
S. Oda
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