Khalafalla, M., Mizuta, Hiroshi, Oda, S. and Durrani, Z. A. K. (2005) Variation of Electrostatic Coupling and Investigation of Current Percolation Paths in Nanocrystalline Silicon Cross Transistors. IEEE Silicon Nanoelectronics Workshop, , Kyoto, Japan.
Record type:
Conference or Workshop Item
(Poster)
More information
Published date: June 2005
Additional Information:
Event Dates: June 2005
Venue - Dates:
IEEE Silicon Nanoelectronics Workshop, , Kyoto, Japan, 2005-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266318
URI: http://eprints.soton.ac.uk/id/eprint/266318
PURE UUID: 74c48dcf-784c-4c8a-9d40-955d7cd39586
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Date deposited: 23 Jul 2008 11:24
Last modified: 14 Mar 2024 08:25
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Contributors
Author:
M. Khalafalla
Author:
Hiroshi Mizuta
Author:
S. Oda
Author:
Z. A. K. Durrani
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