Variation of Electrostatic Coupling and Investigation of Current Percolation Paths in Nanocrystalline Silicon Cross Transistors


Khalafalla, M., Mizuta, Hiroshi, Oda, S. and Durrani, Z. A. K. (2005) Variation of Electrostatic Coupling and Investigation of Current Percolation Paths in Nanocrystalline Silicon Cross Transistors. At IEEE Silicon Nanoelectronics Workshop, Kyoto,

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Item Type: Conference or Workshop Item (Poster)
Additional Information: Event Dates: June 2005
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 266318
Date Deposited: 23 Jul 2008 11:24
Last Modified: 02 Mar 2012 13:42
Contributors: Khalafalla, M. (Author)
Mizuta, Hiroshi (Author)
Oda, S. (Author)
Durrani, Z. A. K. (Author)
Date: June 2005
Additional Information: Event Dates: June 2005
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266318

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