Yield Model Characterization for Analogue Integrated Circuit Using Pareto-Optimal Surface
Ali, Sawal, Wilcock, Reuben, Wilson, Peter and Brown, Andrew (2008) Yield Model Characterization for Analogue Integrated Circuit Using Pareto-Optimal Surface. At CDNLive 2008, Munich, Germany,
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| Item Type: | Conference or Workshop Item (Speech) |
|---|---|
| Additional Information: | Event Dates: 28 April 2008 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 266473 |
| Date Deposited: | 01 Aug 2008 11:27 |
| Last Modified: | 01 Mar 2012 17:48 |
| Contributors: | Ali, Sawal (Author) Wilcock, Reuben (Author) Wilson, Peter (Author) Brown, Andrew (Author) |
| Date: | April 2008 |
| Additional Information: | Event Dates: 28 April 2008 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/266473 |
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