Yield Model Characterization for Analogue Integrated Circuit Using Pareto-Optimal Surface


Ali, Sawal, Wilcock, Reuben, Wilson, Peter and Brown, Andrew (2008) Yield Model Characterization for Analogue Integrated Circuit Using Pareto-Optimal Surface. At CDNLive 2008, Munich, Germany,

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Item Type: Conference or Workshop Item (Speech)
Additional Information: Event Dates: 28 April 2008
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 266473
Date Deposited: 01 Aug 2008 11:27
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266473

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