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Optimal Sizing of Configurable Devices to Reduce Variability in Integrated Circuits

Optimal Sizing of Configurable Devices to Reduce Variability in Integrated Circuits
Optimal Sizing of Configurable Devices to Reduce Variability in Integrated Circuits
This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) structure is presented that allows the adjustment of devices after manufacture. The technique enables both performance and yield to be improved as part of the normal test process. The optimal sizing of the inserted CAT devices is crucial to ensure the greatest improvement in yield and this paper considers this challenge in detail. An analysis and description of the underlying theory of the sizing problem is given along with examples of incorrect sizing. Guidelines to achieve optimal CAT sizing are proposed, and results are provided to demonstrate the overall effectiveness of the CAT approach.
Wilson, Peter
0bb420af-a54f-4dcc-9564-da53a4e0ef9e
Wilcock, Reuben
039894e9-f32d-49e0-9ebd-fb13bc489feb
Wilson, Peter
0bb420af-a54f-4dcc-9564-da53a4e0ef9e
Wilcock, Reuben
039894e9-f32d-49e0-9ebd-fb13bc489feb

Wilson, Peter and Wilcock, Reuben (2009) Optimal Sizing of Configurable Devices to Reduce Variability in Integrated Circuits. DATE, 2009, Nice, France. 20 - 24 Apr 2009. (In Press)

Record type: Conference or Workshop Item (Paper)

Abstract

This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) structure is presented that allows the adjustment of devices after manufacture. The technique enables both performance and yield to be improved as part of the normal test process. The optimal sizing of the inserted CAT devices is crucial to ensure the greatest improvement in yield and this paper considers this challenge in detail. An analysis and description of the underlying theory of the sizing problem is given along with examples of incorrect sizing. Guidelines to achieve optimal CAT sizing are proposed, and results are provided to demonstrate the overall effectiveness of the CAT approach.

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More information

Accepted/In Press date: April 2009
Additional Information: Event Dates: 20-24 April, 2009
Venue - Dates: DATE, 2009, Nice, France, 2009-04-20 - 2009-04-24
Organisations: EEE

Identifiers

Local EPrints ID: 267213
URI: http://eprints.soton.ac.uk/id/eprint/267213
PURE UUID: 445c0c02-7dd8-43c7-9162-8ea9797fc358

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Date deposited: 29 Mar 2009 08:58
Last modified: 14 Mar 2024 08:46

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Contributors

Author: Peter Wilson
Author: Reuben Wilcock

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