Can clock faults be detected through functional test?
Can clock faults be detected through functional test?
We analyze the probability to detect clock faults indirectly through conventional functional testing by considering realistic datapaths derived from ISCAS'85 benchmarks. We show that, even optimistically assuming that we are able to test all short and long paths for min and max delay violations, the detection of clock faults can not be guaranteed, thus mandating new, specific testing approaches for clock faults, otherwise possibly compromising the system correct operation in the field, with dramatic consequences on product quality and defect level.
1-4244-0185-2
168-171
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Cazeaux, Jose' Manuel
de02151c-4f59-4686-a730-18f78d372562
April 2006
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Cazeaux, Jose' Manuel
de02151c-4f59-4686-a730-18f78d372562
Metra, Cecilia, Rossi, Daniele, Omana, Martin and Cazeaux, Jose' Manuel
(2006)
Can clock faults be detected through functional test?
2006 IEEE Design & Diagnostics in Electronic Circuits and Systems, Prague, Czech Republic.
18 - 21 Apr 2006.
.
(doi:10.1109/DDECS.2006.1649606).
Record type:
Conference or Workshop Item
(Paper)
Abstract
We analyze the probability to detect clock faults indirectly through conventional functional testing by considering realistic datapaths derived from ISCAS'85 benchmarks. We show that, even optimistically assuming that we are able to test all short and long paths for min and max delay violations, the detection of clock faults can not be guaranteed, thus mandating new, specific testing approaches for clock faults, otherwise possibly compromising the system correct operation in the field, with dramatic consequences on product quality and defect level.
Text
ddecs06.pdf
- Accepted Manuscript
More information
Published date: April 2006
Venue - Dates:
2006 IEEE Design & Diagnostics in Electronic Circuits and Systems, Prague, Czech Republic, 2006-04-18 - 2006-04-21
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368899
URI: http://eprints.soton.ac.uk/id/eprint/368899
ISBN: 1-4244-0185-2
PURE UUID: f789643e-2301-4f1b-817e-94138cbd54ed
Catalogue record
Date deposited: 06 Oct 2014 13:18
Last modified: 14 Mar 2024 17:55
Export record
Altmetrics
Contributors
Author:
Cecilia Metra
Author:
Daniele Rossi
Author:
Martin Omana
Author:
Jose' Manuel Cazeaux
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics