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A low-cost, radiation-hardened method for pipeline protection in microprocessors

A low-cost, radiation-hardened method for pipeline protection in microprocessors
A low-cost, radiation-hardened method for pipeline protection in microprocessors
The aggressive scaling of semiconductor technology has significantly increased the radiation-induced soft error rate in modern microprocessors. Meanwhile, due to the increasing complexity of modern processor pipelines and the limited error-tolerance capabilities that previous radiation hardening techniques can provide, the existing pipeline protection mechanisms cannot achieve complete protection. This paper proposes a complete and cost-effective pipeline protection mechanism using a self-checking architecture. The radiation hardened pipeline is achieved by incorporating SETTOFF-based self-checking cells into the sequential cells of the pipeline. A replay recovery mechanism is also developed at the architectural level to recover the detected errors. The proposed pipeline protection technique is implemented in an OpenRISC microprocessor in 65nm technology. A gate-level transient fault injection and analysis technique is used to evaluate the error-tolerance capability of the proposed hardened pipeline design. The results show that compared to techniques such as TMR, the SETTOFF-based self-checking technique requires over 30% less area and 80% less power overheads. Meanwhile, the error-tolerant and self-checking capabilities of the register allow the proposed pipeline protection technique to provide a noticeably higher level of reliability for different parts of the pipeline compared to previous pipeline protection techniques.
1063-8210
1688-1701
Lin, Yang
4e10582f-310c-42c9-9bad-c6f8aa409a95
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Lin, Yang
4e10582f-310c-42c9-9bad-c6f8aa409a95
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33

Lin, Yang, Zwolinski, Mark and Halak, Basel (2016) A low-cost, radiation-hardened method for pipeline protection in microprocessors. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 24 (5), 1688-1701. (doi:10.1109/TVLSI.2015.2475167).

Record type: Article

Abstract

The aggressive scaling of semiconductor technology has significantly increased the radiation-induced soft error rate in modern microprocessors. Meanwhile, due to the increasing complexity of modern processor pipelines and the limited error-tolerance capabilities that previous radiation hardening techniques can provide, the existing pipeline protection mechanisms cannot achieve complete protection. This paper proposes a complete and cost-effective pipeline protection mechanism using a self-checking architecture. The radiation hardened pipeline is achieved by incorporating SETTOFF-based self-checking cells into the sequential cells of the pipeline. A replay recovery mechanism is also developed at the architectural level to recover the detected errors. The proposed pipeline protection technique is implemented in an OpenRISC microprocessor in 65nm technology. A gate-level transient fault injection and analysis technique is used to evaluate the error-tolerance capability of the proposed hardened pipeline design. The results show that compared to techniques such as TMR, the SETTOFF-based self-checking technique requires over 30% less area and 80% less power overheads. Meanwhile, the error-tolerant and self-checking capabilities of the register allow the proposed pipeline protection technique to provide a noticeably higher level of reliability for different parts of the pipeline compared to previous pipeline protection techniques.

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Accepted/In Press date: 19 August 2015
Published date: 1 May 2016
Organisations: EEE

Identifiers

Local EPrints ID: 381050
URI: http://eprints.soton.ac.uk/id/eprint/381050
ISSN: 1063-8210
PURE UUID: c1008d57-3552-4ea9-9d9b-077d57585241
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X
ORCID for Basel Halak: ORCID iD orcid.org/0000-0003-3470-7226

Catalogue record

Date deposited: 22 Sep 2015 15:47
Last modified: 15 Mar 2024 03:39

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Contributors

Author: Yang Lin
Author: Mark Zwolinski ORCID iD
Author: Basel Halak ORCID iD

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