Optical quality ZnSe films on silicon for mid-IR waveguides
Optical quality ZnSe films on silicon for mid-IR waveguides
ZnSe films were deposited on silicon substrates by evaporation and RF-sputtering and compared for their structural, morphological and optical properties. The deposited films were tested as waveguide cladding and the evaporated films showed lower loss.
Mittal, Vinita
fd5ee9dd-7770-416f-8f47-50ca158b39b0
Wilkinson, James
73483cf3-d9f2-4688-9b09-1c84257884ca
Murugan, Ganapathy Senthil
a867686e-0535-46cc-ad85-c2342086b25b
Mittal, Vinita
fd5ee9dd-7770-416f-8f47-50ca158b39b0
Wilkinson, James
73483cf3-d9f2-4688-9b09-1c84257884ca
Murugan, Ganapathy Senthil
a867686e-0535-46cc-ad85-c2342086b25b
Mittal, Vinita, Wilkinson, James and Murugan, Ganapathy Senthil
(2016)
Optical quality ZnSe films on silicon for mid-IR waveguides.
Conference on Lasers and Electro-Optics 2016, , San Jose, United States.
05 - 10 Jun 2016.
2 pp
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
ZnSe films were deposited on silicon substrates by evaporation and RF-sputtering and compared for their structural, morphological and optical properties. The deposited films were tested as waveguide cladding and the evaporated films showed lower loss.
Text
Optical Quality ZnSe Films on Silicon for Mid-IR Waveguides.docx
- Accepted Manuscript
More information
e-pub ahead of print date: 7 June 2016
Venue - Dates:
Conference on Lasers and Electro-Optics 2016, , San Jose, United States, 2016-06-05 - 2016-06-10
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 392993
URI: http://eprints.soton.ac.uk/id/eprint/392993
PURE UUID: 302a9334-7979-4252-ab75-8268ae3576bb
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Date deposited: 19 Apr 2016 09:15
Last modified: 15 Mar 2024 03:23
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Contributors
Author:
Vinita Mittal
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