A theoretical treatment of void electromigration in the strip geometry
A theoretical treatment of void electromigration in the strip geometry
The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted
279-289
Ben Amar, Martine
642b3f67-e9e6-4fe2-a385-30ca2ca50260
Cummings, Linda
70a32c64-8b0a-4740-a3bd-598866668be5
Richardson, Giles
3fd8e08f-e615-42bb-a1ff-3346c5847b91
2 June 2000
Ben Amar, Martine
642b3f67-e9e6-4fe2-a385-30ca2ca50260
Cummings, Linda
70a32c64-8b0a-4740-a3bd-598866668be5
Richardson, Giles
3fd8e08f-e615-42bb-a1ff-3346c5847b91
Ben Amar, Martine, Cummings, Linda and Richardson, Giles
(2000)
A theoretical treatment of void electromigration in the strip geometry.
Computational Materials Science, 17 (2-4), .
(doi:10.1016/S0927-0256(00)00039-2).
Abstract
The void electromigration process in the strip geometry is investigated analytically and numerically. The void is assumed to travel either along the axis of symmetry of the metal strip or at the boundary. In each case, the shape, the velocity of the void and the characteristic electrical current are predicted
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Computational Materials Science 2000 Amar.pdf
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Published date: 2 June 2000
Organisations:
Applied Mathematics
Identifiers
Local EPrints ID: 404027
URI: http://eprints.soton.ac.uk/id/eprint/404027
ISSN: 0927-0256
PURE UUID: 37fee0a3-9639-4b12-9c31-7ba012fa9436
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Date deposited: 22 Dec 2016 15:22
Last modified: 16 Mar 2024 04:00
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Author:
Martine Ben Amar
Author:
Linda Cummings
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