Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations
The paper presents a test stimulus generation and fault simulation methodology for the detection of catastrophic faults in analog circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evaluated taking account of the potential fault masking effects of process spread on the faulty circuit responses. A new test effectiveness metric of probability of detection is defined and the application of the technique to an analog multiplier circuit is presented. The fault coverage figures are therefore more meaningful than those obtained with a fixed threshold.
11-23
Spinks, SJ
2201252d-2cbf-422c-8f3b-e1d7a50964b0
Chalk, CD
5a6d2942-9d4f-4054-b62f-1abcbe740f1c
Bell, IM
1a4fd04d-ad49-4e7d-bcbc-74efdd7e3e30
Zwolinski, M
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
February 2004
Spinks, SJ
2201252d-2cbf-422c-8f3b-e1d7a50964b0
Chalk, CD
5a6d2942-9d4f-4054-b62f-1abcbe740f1c
Bell, IM
1a4fd04d-ad49-4e7d-bcbc-74efdd7e3e30
Zwolinski, M
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Spinks, SJ, Chalk, CD, Bell, IM and Zwolinski, M
(2004)
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations.
Journal of Electronic Testing: Theory and Applications, 20 (1), .
Abstract
The paper presents a test stimulus generation and fault simulation methodology for the detection of catastrophic faults in analog circuits. The test methodology chosen for evaluation is RMS AC supply current monitoring. Tests are generated and evaluated taking account of the potential fault masking effects of process spread on the faulty circuit responses. A new test effectiveness metric of probability of detection is defined and the application of the technique to an analog multiplier circuit is presented. The fault coverage figures are therefore more meaningful than those obtained with a fixed threshold.
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JETT763-01.pdf
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Published date: February 2004
Organisations:
EEE
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Local EPrints ID: 258865
URI: http://eprints.soton.ac.uk/id/eprint/258865
ISSN: 0923-8174
PURE UUID: 517265db-36bd-493b-b731-7501c2d22d5d
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Date deposited: 02 Mar 2005
Last modified: 15 Mar 2024 02:39
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Author:
SJ Spinks
Author:
CD Chalk
Author:
IM Bell
Author:
M Zwolinski
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