A VHDL-AMS Based Time Domain Skin Depth Model for Edge Coupled Lossy Transmission Stripline
A VHDL-AMS Based Time Domain Skin Depth Model for Edge Coupled Lossy Transmission Stripline
This contribution presents a time-domain model of the skin depth effect in a lossy transmission line. The model was developed and implemented in VHDL-AMS for a two wire edge coupled line but it is general and can be used for other types of lossy transmission line and high-frequency applications with skin depth effect. The salient feature of the model is the use of signal variation rate instead of frequency in the signal dependent resistance that models the skin depth losses. VHDL-AMS simulation experiments are presented to validate the model.
transmission line skin effect dielectric conductance VHDL-AMS
197-208
Burford, M
fa84649d-f8f7-4bca-98b9-c0551a04203d
Kazmierski, T
a97d7958-40c3-413f-924d-84545216092a
2005
Burford, M
fa84649d-f8f7-4bca-98b9-c0551a04203d
Kazmierski, T
a97d7958-40c3-413f-924d-84545216092a
Burford, M and Kazmierski, T
(2005)
A VHDL-AMS Based Time Domain Skin Depth Model for Edge Coupled Lossy Transmission Stripline.
Forum on Specification and Design Languages 2005, Lausanne, Switzerland.
.
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Abstract
This contribution presents a time-domain model of the skin depth effect in a lossy transmission line. The model was developed and implemented in VHDL-AMS for a two wire edge coupled line but it is general and can be used for other types of lossy transmission line and high-frequency applications with skin depth effect. The salient feature of the model is the use of signal variation rate instead of frequency in the signal dependent resistance that models the skin depth losses. VHDL-AMS simulation experiments are presented to validate the model.
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Published date: 2005
Additional Information:
Event Dates: September 27-30th 2005
Venue - Dates:
Forum on Specification and Design Languages 2005, Lausanne, Switzerland, 2005-09-30
Keywords:
transmission line skin effect dielectric conductance VHDL-AMS
Organisations:
EEE
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Local EPrints ID: 262768
URI: http://eprints.soton.ac.uk/id/eprint/262768
PURE UUID: 0162cc5f-7da1-437b-bd83-d1067c284858
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Date deposited: 30 Jun 2006
Last modified: 14 Mar 2024 07:17
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Contributors
Author:
M Burford
Author:
T Kazmierski
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