Yang, Z. R., Zwolinski, M. and Chalk, C.D. (1998) Fault Detection and Classification in Analogue Integrated Circuits using Robust Heteroscedastic Probabilistic Neural Networks.
Record type:
Conference or Workshop Item
(Other)
More information
Published date: 1998
Additional Information:
4th IEEE International Mixed Signal Testing Workshop Organisation: IEEE
Organisations:
EEE
Identifiers
Local EPrints ID: 251851
URI: http://eprints.soton.ac.uk/id/eprint/251851
PURE UUID: 823548c3-b50b-4944-bdf5-d328ec3a6e8b
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Date deposited: 12 Nov 1999
Last modified: 15 Mar 2024 02:39
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Contributors
Author:
Z. R. Yang
Author:
M. Zwolinski
Author:
C.D. Chalk
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