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Fault Detection and Classification in Analogue Integrated Circuits using Robust Heteroscedastic Probabilistic Neural Networks

Yang, Z. R., Zwolinski, M. and Chalk, C.D. (1998) Fault Detection and Classification in Analogue Integrated Circuits using Robust Heteroscedastic Probabilistic Neural Networks

Record type: Conference or Workshop Item (Other)
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More information

Published date: 1998
Additional Information: 4th IEEE International Mixed Signal Testing Workshop Organisation: IEEE
Organisations: EEE

Identifiers

Local EPrints ID: 251851
URI: http://eprints.soton.ac.uk/id/eprint/251851
PURE UUID: 823548c3-b50b-4944-bdf5-d328ec3a6e8b
ORCID for M. Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 12 Nov 1999
Last modified: 18 Jul 2017 10:08

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Contributors

Author: Z. R. Yang
Author: M. Zwolinski ORCID iD
Author: C.D. Chalk

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