Testing analog circuits by supply voltage variation and supply current monitoring

Kilic, Y. and Zwolinski, M. (1999) Testing analog circuits by supply voltage variation and supply current monitoring. pp. 155-8 .

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Published date: 1999

Additional Information: IEEE Custom Integrated Circuits Conference Organisation: IEEE

Organisations: EEE

Local EPrints ID: 251856

URI: http://eprints.soton.ac.uk/id/eprint/251856

PURE UUID: c21de543-5482-4019-a983-1fc08ac73ee2

ORCID for M. Zwolinski:

orcid.org/0000-0002-2230-625X

Date deposited: 12 Nov 1999

Last modified: 15 Mar 2024 02:39

Author: Y. Kilic

Author: M. Zwolinski

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