Characterisation of Analog Macromodels under Fault Conditions using a Probabilistic Neural Network

Zwolinski, M. and Tan, C.H. (1999) Characterisation of Analog Macromodels under Fault Conditions using a Probabilistic Neural Network. pp. 157-60 .

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Published date: 1999

Additional Information: 5th IEEE International Mixed Signal Testing Workshop Organisation: IEEE

Organisations: EEE

Local EPrints ID: 251858

URI: http://eprints.soton.ac.uk/id/eprint/251858

PURE UUID: 42aec3e8-45e8-443a-ba1c-46da509422d5

ORCID for M. Zwolinski:

orcid.org/0000-0002-2230-625X

Date deposited: 30 Mar 2000

Last modified: 15 Mar 2024 02:39

Author: M. Zwolinski

Author: C.H. Tan

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