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Kim, Dong-Hun, Park, Il-Han., Shin, Myoung-Chul and Sykulski, J.K. (2002) Generalized Continuum Sensitivity Formula for Optimum Design of Electrode and Dielectric Contours At CEFC'2002 IEEE Conference on Electromagnetic Field Computation, Italy. 16 - 19 Jun 2002. , p. 295.

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