Finite element optimizations for efficient non-linear electrical tomography reconstruction
Finite element optimizations for efficient non-linear electrical tomography reconstruction
Electrical Tomography can produce accurate results only if the underlying 2D or 3D volume discretization is chosen suitably for the applied numerical algorithm. We give general indications where and how to optimize a finite element discretization of a volume under investigation to enable efficient computation of potential distributions and the reconstruction of materials. For this, we present an error estimator and material-gradient indicator as a driver for adaptive mesh refinement and show how finite element mesh properties affect the efficiency and accuracy of the solutions.
0 85316 224 7
406-417
Molinari, M.
47944a31-9242-4dcf-a527-40309e104fbf
Fangohr, H.
9b7cfab9-d5dc-45dc-947c-2eba5c81a160
Generowicz, J.
446ae379-78d0-4830-bf27-f80f351c10e7
Cox, S.J.
0e62aaed-24ad-4a74-b996-f606e40e5c55
August 2001
Molinari, M.
47944a31-9242-4dcf-a527-40309e104fbf
Fangohr, H.
9b7cfab9-d5dc-45dc-947c-2eba5c81a160
Generowicz, J.
446ae379-78d0-4830-bf27-f80f351c10e7
Cox, S.J.
0e62aaed-24ad-4a74-b996-f606e40e5c55
Molinari, M., Fangohr, H., Generowicz, J. and Cox, S.J.
(2001)
Finite element optimizations for efficient non-linear electrical tomography reconstruction.
Proceedings of the 2nd World Congress on Industrial Process Tomography, Hanover, Germany.
29 - 31 Aug 2001.
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
Electrical Tomography can produce accurate results only if the underlying 2D or 3D volume discretization is chosen suitably for the applied numerical algorithm. We give general indications where and how to optimize a finite element discretization of a volume under investigation to enable efficient computation of potential distributions and the reconstruction of materials. For this, we present an error estimator and material-gradient indicator as a driver for adaptive mesh refinement and show how finite element mesh properties affect the efficiency and accuracy of the solutions.
Text
molinari_FEOptimEIT_wcipt_2001.pdf
- Other
Text
molinari_FEOptimEIT_wcipt_2001_p406-417.pdf
- Accepted Manuscript
More information
Published date: August 2001
Additional Information:
Proceedings of the 2nd World Congress on Industrial Process Tomography, 29-31 August 2001, Hannover, Germany Conference Proceedings. Organisation: Virtual Centre for Industrial Process Tomography (VCIPT), IChemE, IEE, ATS-NET, GVC-VDI
Venue - Dates:
Proceedings of the 2nd World Congress on Industrial Process Tomography, Hanover, Germany, 2001-08-29 - 2001-08-31
Organisations:
Electronics & Computer Science
Identifiers
Local EPrints ID: 255994
URI: http://eprints.soton.ac.uk/id/eprint/255994
ISBN: 0 85316 224 7
PURE UUID: 9ab0c44d-24f1-4bbf-a5a6-56d8bc8d4abb
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Date deposited: 26 Feb 2002
Last modified: 15 Mar 2024 03:03
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Contributors
Author:
M. Molinari
Author:
J. Generowicz
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