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Using High-Level Synthesis to Implement On-Line Testability

Using High-Level Synthesis to Implement On-Line Testability
Using High-Level Synthesis to Implement On-Line Testability
On-line testing increases system reliability, which is essential in a number of applications. High-level synthesis, on the other hand, offers fast time-to-market and allows quick and painless design space exploration. In this work, we investigate on-line testing in the high-level synthesis context. Further, we propose a new technique (inversion testing) and demonstrate its potential benefits.
Oikonomakos, Petros
2d4259bc-b7a3-4a68-af0f-cc680870e949
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Oikonomakos, Petros
2d4259bc-b7a3-4a68-af0f-cc680870e949
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0

Oikonomakos, Petros and Zwolinski, Mark (2001) Using High-Level Synthesis to Implement On-Line Testability At IEEE Real-Time Embedded Systems Workshop.

Record type: Conference or Workshop Item (Other)

Abstract

On-line testing increases system reliability, which is essential in a number of applications. High-level synthesis, on the other hand, offers fast time-to-market and allows quick and painless design space exploration. In this work, we investigate on-line testing in the high-level synthesis context. Further, we propose a new technique (inversion testing) and demonstrate its potential benefits.

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More information

Published date: December 2001
Additional Information: presented in IEEE Real-Time Embedded Systems Workshop, December 3, 2001 CD-ROM. Organisation: IEEE
Venue - Dates: IEEE Real-Time Embedded Systems Workshop, 2001-12-01
Organisations: EEE

Identifiers

Local EPrints ID: 256405
URI: http://eprints.soton.ac.uk/id/eprint/256405
PURE UUID: 1cd85270-7c99-4fa2-aaac-8e232a593082
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 01 May 2002
Last modified: 18 Jul 2017 09:46

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Contributors

Author: Petros Oikonomakos
Author: Mark Zwolinski ORCID iD

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