Variable-Length Input Huffman Coding for System-on-a-Chip Test
Variable-Length Input Huffman Coding for System-on-a-Chip Test
This paper presents a new compression method for embedded core-based system-on-a-chip test. In addition to the new compression method, this paper analyzes the three test data compression environment (TDCE) parameters: compression ratio, area overhead and test application time, and explains the impact of the factors which influence these three parameters. The proposed method is based on a new Variable-length Input Huffman Coding scheme, which proves to be the key element that determines all the factors that influence the TDCE parameters. Extensive experimental comparisons show that, when compared to three previous approaches [1–3], which reduce some test data compression environment’s parameters at the expense of the others, the proposed method is capable of improving on all the three TDCE parameters simultaneously.
783-783
Gonciari, Paul Theo
a7b9003b-b7d9-4ae6-8164-d878a0b59e43
Al-Hashimi, Bashir
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Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
June 2003
Gonciari, Paul Theo
a7b9003b-b7d9-4ae6-8164-d878a0b59e43
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
Gonciari, Paul Theo, Al-Hashimi, Bashir and Nicolici, Nicola
(2003)
Variable-Length Input Huffman Coding for System-on-a-Chip Test.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 22 (6), .
Abstract
This paper presents a new compression method for embedded core-based system-on-a-chip test. In addition to the new compression method, this paper analyzes the three test data compression environment (TDCE) parameters: compression ratio, area overhead and test application time, and explains the impact of the factors which influence these three parameters. The proposed method is based on a new Variable-length Input Huffman Coding scheme, which proves to be the key element that determines all the factors that influence the TDCE parameters. Extensive experimental comparisons show that, when compared to three previous approaches [1–3], which reduce some test data compression environment’s parameters at the expense of the others, the proposed method is capable of improving on all the three TDCE parameters simultaneously.
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pgonciari_tcad03.pdf
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Published date: June 2003
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 258321
URI: http://eprints.soton.ac.uk/id/eprint/258321
ISSN: 0278-0070
PURE UUID: 11185d3e-1e44-402b-9b8d-7f3f1b364790
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Date deposited: 07 Oct 2003
Last modified: 14 Mar 2024 06:07
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Contributors
Author:
Paul Theo Gonciari
Author:
Bashir Al-Hashimi
Author:
Nicola Nicolici
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