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Testability Trade-offs for BIST Data Paths

Testability Trade-offs for BIST Data Paths
Testability Trade-offs for BIST Data Paths
Low power DFT, BIST
0923-8174
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
Al-Hashimi, Bashir M.
0b29c671-a6d2-459c-af68-c4614dce3b5d
Nicolici, Nicola
61efa5a6-7da8-4c33-8e68-2679a9bb0871
Al-Hashimi, Bashir M.
0b29c671-a6d2-459c-af68-c4614dce3b5d

Nicolici, Nicola and Al-Hashimi, Bashir M. (2004) Testability Trade-offs for BIST Data Paths Journal of Electronic Testing, Theory and Applications (JETTA), 20, Is

Record type: Article
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More information

Published date: April 2004
Additional Information: Commentary On: Journal of Electronic Testing, Theory and Applications (JETTA)
Keywords: Low power DFT, BIST
Organisations: Electronic & Software Systems

Identifiers

Local EPrints ID: 258782
URI: http://eprints.soton.ac.uk/id/eprint/258782
ISSN: 0923-8174
PURE UUID: 93c7938b-2d2a-4d4a-b356-8f452df98cf3

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Date deposited: 22 Jan 2004
Last modified: 18 Jul 2017 09:30

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Contributors

Author: Nicola Nicolici

University divisions

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