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On-chip timing measurement architecture with femtosecond resolution

On-chip timing measurement architecture with femtosecond resolution
On-chip timing measurement architecture with femtosecond resolution
A new timing measurement architecture based on the time-to-digital conversion technique is presented. The architecture occupies a small silicon area (200x185µm) in a 0.12µm CMOS Process and can achieve tens of femtoseconds timing resolution, which is the highest reported to date.
0013-5194
528-530
Collins, Matthew
5afb2125-3382-4c0b-958e-37efe20bc5a1
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Wilson, Peter
8a65c092-c197-4f43-b8fc-e12977783cb3
Collins, Matthew
5afb2125-3382-4c0b-958e-37efe20bc5a1
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Wilson, Peter
8a65c092-c197-4f43-b8fc-e12977783cb3

Collins, Matthew, Al-Hashimi, Bashir and Wilson, Peter (2006) On-chip timing measurement architecture with femtosecond resolution. Electronics Letters, 42 (9), 528-530.

Record type: Article

Abstract

A new timing measurement architecture based on the time-to-digital conversion technique is presented. The architecture occupies a small silicon area (200x185µm) in a 0.12µm CMOS Process and can achieve tens of femtoseconds timing resolution, which is the highest reported to date.

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More information

Published date: April 2006
Organisations: Electronic & Software Systems, EEE

Identifiers

Local EPrints ID: 262543
URI: http://eprints.soton.ac.uk/id/eprint/262543
ISSN: 0013-5194
PURE UUID: d2f24d54-f86e-47cf-8016-6f1b809c2282

Catalogue record

Date deposited: 11 May 2006
Last modified: 14 Mar 2024 07:13

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Contributors

Author: Matthew Collins
Author: Bashir Al-Hashimi
Author: Peter Wilson

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