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Dynamic Voltage Scaling Aware Delay Fault Testing

Zain Ali, Noohul Basheer, Zwolinski, Mark, Al-Hashimi, Bashir M and Harrod, Peter (2006) Dynamic Voltage Scaling Aware Delay Fault Testing At European Test Symposium. 21 - 25 May 2006.

Record type: Conference or Workshop Item (Paper)


The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faults. This paper analyses the influence of different voltage/frequency settings on fault detection within a DVS application. In particular, the effect of supply voltage on different types of delay faults is considered. This paper presents a study of these problems with simulation results. We have demonstrated that the test application time increases as we reduce the test voltage. We have also shown that for newer technologies we do not have to go to very low voltage levels for delay fault testing. We conclude that it is necessary to test at more than one operating voltage and that the lowest operating voltage does not necessarily give the best fault cover.

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Published date: 2006
Additional Information: Event Dates: May 21-25, 2006
Venue - Dates: European Test Symposium, 2006-05-21 - 2006-05-25
Keywords: Dynamic Voltage Scaling, Delay Fault Testing, Defect Based Testing
Organisations: Electronic & Software Systems, EEE


Local EPrints ID: 262653
PURE UUID: 2f24460a-2e82-4b0c-887c-bad8dd0360a7
ORCID for Mark Zwolinski: ORCID iD

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Date deposited: 30 May 2006
Last modified: 18 Jul 2017 08:49

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Author: Noohul Basheer Zain Ali
Author: Mark Zwolinski ORCID iD
Author: Peter Harrod

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