Satpathy, Manoranjan, Butler, Michael, Leuschel, Michael and Ramesh, S (2007) Automatic Testing from Formal Specifications. International Conference on Tests And Proofs (TAP), ETH Zurich, Switzerland. 12 - 13 Feb 2007.
Record type:
Conference or Workshop Item
(Paper)
More information
Published date: 2007
Additional Information:
Event Dates: 12-13 February 2007
Venue - Dates:
International Conference on Tests And Proofs (TAP), ETH Zurich, Switzerland, 2007-02-12 - 2007-02-13
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 264457
URI: http://eprints.soton.ac.uk/id/eprint/264457
PURE UUID: 7ad09f24-f4f8-418a-b1cb-87ab0397c793
Catalogue record
Date deposited: 05 Sep 2007
Last modified: 15 Mar 2024 02:50
Export record
Contributors
Author:
Manoranjan Satpathy
Author:
Michael Butler
Author:
Michael Leuschel
Author:
S Ramesh
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.