Automatic Testing from Formal Specifications


Satpathy, Manoranjan, Butler, Michael, Leuschel, Michael and Ramesh, S (2007) Automatic Testing from Formal Specifications At International Conference on Tests And Proofs (TAP), Switzerland. 12 - 13 Feb 2007.

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Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 12-13 February 2007
Venue - Dates: International Conference on Tests And Proofs (TAP), Switzerland, 2007-02-12 - 2007-02-13
Organisations: Electronic & Software Systems
ePrint ID: 264457
Date :
Date Event
2007Published
Date Deposited: 05 Sep 2007
Last Modified: 23 Feb 2017 11:08
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/264457

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