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Automatic Testing from Formal Specifications

Satpathy, Manoranjan, Butler, Michael, Leuschel, Michael and Ramesh, S (2007) Automatic Testing from Formal Specifications At International Conference on Tests And Proofs (TAP), Switzerland. 12 - 13 Feb 2007.

Record type: Conference or Workshop Item (Paper)
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Published date: 2007
Additional Information: Event Dates: 12-13 February 2007
Venue - Dates: International Conference on Tests And Proofs (TAP), Switzerland, 2007-02-12 - 2007-02-13
Organisations: Electronic & Software Systems


Local EPrints ID: 264457
PURE UUID: 7ad09f24-f4f8-418a-b1cb-87ab0397c793
ORCID for Michael Butler: ORCID iD

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Date deposited: 05 Sep 2007
Last modified: 18 Jul 2017 07:36

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Author: Manoranjan Satpathy
Author: Michael Butler ORCID iD
Author: Michael Leuschel
Author: S Ramesh

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