Ali, Sawal M, Wilson, Peter R and Brown, Andrew D (2007) Yield Predictive Model Characterization in Analog Circuit Design. International Synposium on Integrated Circuits 2007, Singapore.
Record type:
Conference or Workshop Item
(Other)
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Published date: September 2007
Additional Information:
Event Dates: September 2007
Venue - Dates:
International Synposium on Integrated Circuits 2007, Singapore, 2007-09-01
Organisations:
EEE
Identifiers
Local EPrints ID: 264672
URI: http://eprints.soton.ac.uk/id/eprint/264672
PURE UUID: a4b001ed-7354-4429-afb6-7efa184a9d0d
Catalogue record
Date deposited: 11 Oct 2007
Last modified: 14 Mar 2024 07:54
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Contributors
Author:
Sawal M Ali
Author:
Peter R Wilson
Author:
Andrew D Brown
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