Marques-Silva, Joao and Sakallah, Karem (1997) Robust Search Algorithms for Test Pattern Generation. Fault-Tolerant Computing Symposium, Seattle, Washington, United States. pp. 152-161 .
Record type:
Conference or Workshop Item
(Paper)
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Published date: 1997
Venue - Dates:
Fault-Tolerant Computing Symposium, Seattle, Washington, United States, 1997-01-01
Organisations:
Electronics & Computer Science
Identifiers
Local EPrints ID: 265001
URI: http://eprints.soton.ac.uk/id/eprint/265001
PURE UUID: a0127729-6cc1-4460-b83a-debccc55f696
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Date deposited: 05 Jan 2008 18:48
Last modified: 14 Mar 2024 08:00
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Contributors
Author:
Joao Marques-Silva
Author:
Karem Sakallah
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