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Robust Search Algorithms for Test Pattern Generation

Marques-Silva, Joao and Sakallah, Karem (1997) Robust Search Algorithms for Test Pattern Generation At Fault-Tolerant Computing Symposium, United States. , pp. 152-161.

Record type: Conference or Workshop Item (Paper)
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Published date: 1997
Venue - Dates: Fault-Tolerant Computing Symposium, United States, 1997-01-01
Organisations: Electronics & Computer Science


Local EPrints ID: 265001
PURE UUID: a0127729-6cc1-4460-b83a-debccc55f696

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Date deposited: 05 Jan 2008 18:48
Last modified: 18 Jul 2017 07:30

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Author: Joao Marques-Silva
Author: Karem Sakallah

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