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Robust Search Algorithms for Test Pattern Generation

Robust Search Algorithms for Test Pattern Generation
Robust Search Algorithms for Test Pattern Generation
152-161
Marques-Silva, Joao
f992f61f-cedd-4897-9f73-1a3ac7ebb35c
Sakallah, Karem
defb7e2c-080d-4c47-8330-d5c6d50ae78a
Marques-Silva, Joao
f992f61f-cedd-4897-9f73-1a3ac7ebb35c
Sakallah, Karem
defb7e2c-080d-4c47-8330-d5c6d50ae78a

Marques-Silva, Joao and Sakallah, Karem (1997) Robust Search Algorithms for Test Pattern Generation. Fault-Tolerant Computing Symposium, United States. pp. 152-161 .

Record type: Conference or Workshop Item (Paper)
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More information

Published date: 1997
Venue - Dates: Fault-Tolerant Computing Symposium, United States, 1997-01-01
Organisations: Electronics & Computer Science

Identifiers

Local EPrints ID: 265001
URI: http://eprints.soton.ac.uk/id/eprint/265001
PURE UUID: a0127729-6cc1-4460-b83a-debccc55f696

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Date deposited: 05 Jan 2008 18:48
Last modified: 18 Nov 2019 20:49

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