Robust Search Algorithms for Test Pattern Generation


Marques-Silva, Joao and Sakallah, Karem (1997) Robust Search Algorithms for Test Pattern Generation At Fault-Tolerant Computing Symposium, United States. , pp. 152-161.

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Item Type: Conference or Workshop Item (Paper)
Venue - Dates: Fault-Tolerant Computing Symposium, United States, 1997-01-01
Organisations: Electronics & Computer Science
ePrint ID: 265001
Date :
Date Event
1997Published
Date Deposited: 05 Jan 2008 18:48
Last Modified: 17 Apr 2017 19:27
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/265001

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