The University of Southampton
University of Southampton Institutional Repository

Stochastic Coulomb blockade in coupled asymmetric silicon dots formed by pattern-dependent oxidation

Stochastic Coulomb blockade in coupled asymmetric silicon dots formed by pattern-dependent oxidation
Stochastic Coulomb blockade in coupled asymmetric silicon dots formed by pattern-dependent oxidation
This paper reports the observation of stochastic Coulomb blockade for the coupled silicon dots. The device was fabricated from the highly doped dual recess structured silicon channel by means of stress induced pattern-dependent oxidation. Sparsely placed Coulomb oscillation characteristics were observed from the transport characteristics at a low temperature and these irregularities decreased linearly as temperature increased. These characteristics were interpreted as the stochastic Coulomb blockade effect, which occurs due to the mismatch between individual dots in the energy spectrum ladder of the serially connected dots
0003-6951
92110
Manoharan, M.
5b5a3df4-7677-4c9b-bdca-c6b8f31e97e6
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Manoharan, M.
5b5a3df4-7677-4c9b-bdca-c6b8f31e97e6
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9

Manoharan, M., Tsuchiya, Yoshishige, Oda, S. and Mizuta, Hiroshi (2008) Stochastic Coulomb blockade in coupled asymmetric silicon dots formed by pattern-dependent oxidation. Applied Physics Letters, 92 (9), 92110. (doi:10.1063/1.2891063).

Record type: Article

Abstract

This paper reports the observation of stochastic Coulomb blockade for the coupled silicon dots. The device was fabricated from the highly doped dual recess structured silicon channel by means of stress induced pattern-dependent oxidation. Sparsely placed Coulomb oscillation characteristics were observed from the transport characteristics at a low temperature and these irregularities decreased linearly as temperature increased. These characteristics were interpreted as the stochastic Coulomb blockade effect, which occurs due to the mismatch between individual dots in the energy spectrum ladder of the serially connected dots

Text
paper_86.pdf - Other
Download (274kB)

More information

Published date: 2008
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266172
URI: http://eprints.soton.ac.uk/id/eprint/266172
ISSN: 0003-6951
PURE UUID: 8ae3c3aa-ab0e-4885-a789-ea267a238e07

Catalogue record

Date deposited: 21 Jul 2008 14:40
Last modified: 14 Mar 2024 08:21

Export record

Altmetrics

Contributors

Author: M. Manoharan
Author: Yoshishige Tsuchiya
Author: S. Oda
Author: Hiroshi Mizuta

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×