Kamiya, T., Furuta, Y., Tan, Y. -T., Durrani, Z. A. K., Mizuta, Hiroshi and Ahmed, H. (2003) Effects of oxidation and annealing temperature on grain boundary properties in polycrystalline silicon probed using nanometer-scale point-contact devices. Solid State Phenomena, 93, 351-354.
Record type:
Article
More information
Published date: 2003
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266206
URI: http://eprints.soton.ac.uk/id/eprint/266206
PURE UUID: 0dea530e-425f-445f-94b7-f23722f25373
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Date deposited: 22 Jul 2008 08:26
Last modified: 14 Mar 2024 08:23
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Contributors
Author:
T. Kamiya
Author:
Y. Furuta
Author:
Y. -T. Tan
Author:
Z. A. K. Durrani
Author:
Hiroshi Mizuta
Author:
H. Ahmed
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