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Modelling of structural and electrical characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime

Modelling of structural and electrical characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime
Modelling of structural and electrical characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime
0021-4922
5837-5840
Evans, G.
e5f4d450-de59-4812-88d2-31033b6f5cce
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Ahmed, H.
f9dabf57-dea0-4cf9-b989-c812b5eedeaf
Evans, G.
e5f4d450-de59-4812-88d2-31033b6f5cce
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Ahmed, H.
f9dabf57-dea0-4cf9-b989-c812b5eedeaf

Evans, G., Mizuta, Hiroshi and Ahmed, H. (2001) Modelling of structural and electrical characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime. Japanese Journal of Applied Physics, 40, 5837-5840.

Record type: Article
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Published date: 2001
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266213
URI: http://eprints.soton.ac.uk/id/eprint/266213
ISSN: 0021-4922
PURE UUID: e8faf5c2-5644-4172-9362-7acda9fd3d82

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Date deposited: 22 Jul 2008 09:01
Last modified: 14 Mar 2024 08:22

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Contributors

Author: G. Evans
Author: Hiroshi Mizuta
Author: H. Ahmed

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