Modelling of structural and electrical characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime
Modelling of structural and electrical characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime
5837-5840
Evans, G.
e5f4d450-de59-4812-88d2-31033b6f5cce
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Ahmed, H.
f9dabf57-dea0-4cf9-b989-c812b5eedeaf
2001
Evans, G.
e5f4d450-de59-4812-88d2-31033b6f5cce
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Ahmed, H.
f9dabf57-dea0-4cf9-b989-c812b5eedeaf
Evans, G., Mizuta, Hiroshi and Ahmed, H.
(2001)
Modelling of structural and electrical characteristics of randomly doped silicon nanowires in the Coulomb-blockade regime.
Japanese Journal of Applied Physics, 40, .
Text
paper_47.pdf
- Other
More information
Published date: 2001
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266213
URI: http://eprints.soton.ac.uk/id/eprint/266213
ISSN: 0021-4922
PURE UUID: e8faf5c2-5644-4172-9362-7acda9fd3d82
Catalogue record
Date deposited: 22 Jul 2008 09:01
Last modified: 14 Mar 2024 08:22
Export record
Contributors
Author:
G. Evans
Author:
Hiroshi Mizuta
Author:
H. Ahmed
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics