Mizuta, Hiroshi, Yamaguchi, K. and Takahashi, S. (1987) Surface Potential Effect on Gate-Drain Avalanche Breakdown in GaAs MESFET's. IEEE Transactions on Electron Devices, ED-34, 2027-2033.
Record type:
Article
More information
Published date: 1987
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266252
URI: http://eprints.soton.ac.uk/id/eprint/266252
PURE UUID: 9df19d39-f314-4422-a980-0cfb19edf25b
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Date deposited: 22 Jul 2008 10:56
Last modified: 14 Mar 2024 08:23
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Contributors
Author:
Hiroshi Mizuta
Author:
K. Yamaguchi
Author:
S. Takahashi
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