Nagami, T., Tsuchiya, Yoshishige, Matsuda, S., Saito, S., Arai, T., Shimada, T., Mizuta, Hiroshi and Oda, S. (2008) Transient response analysis of programming/readout characteristics for NEMS memory. IEEE Silicon Nanoelectronics Workshop, Honolulu. M0430 .
Record type:
Conference or Workshop Item
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Published date: June 2008
Additional Information:
Event Dates: June 2008
Venue - Dates:
IEEE Silicon Nanoelectronics Workshop, Honolulu, 2008-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266265
URI: http://eprints.soton.ac.uk/id/eprint/266265
PURE UUID: 36903fe0-adeb-42b8-8bac-2314c8a3b4f0
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Date deposited: 23 Jul 2008 09:02
Last modified: 14 Mar 2024 08:24
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Contributors
Author:
T. Nagami
Author:
Yoshishige Tsuchiya
Author:
S. Matsuda
Author:
S. Saito
Author:
T. Arai
Author:
T. Shimada
Author:
Hiroshi Mizuta
Author:
S. Oda
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