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Is it possible to avoid uncontrolled multiple tunnel junctions induced by random dopants in heavily-doped silicon single-electron transistor?

Is it possible to avoid uncontrolled multiple tunnel junctions induced by random dopants in heavily-doped silicon single-electron transistor?
Is it possible to avoid uncontrolled multiple tunnel junctions induced by random dopants in heavily-doped silicon single-electron transistor?
P1-22
Manoharan, M.
5b5a3df4-7677-4c9b-bdca-c6b8f31e97e6
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Manoharan, M.
5b5a3df4-7677-4c9b-bdca-c6b8f31e97e6
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9

Manoharan, M., Tsuchiya, Yoshishige, Oda, S. and Mizuta, Hiroshi (2008) Is it possible to avoid uncontrolled multiple tunnel junctions induced by random dopants in heavily-doped silicon single-electron transistor? IEEE Silicon Nanoelectronics Workshop, Honolulu. P1-22 .

Record type: Conference or Workshop Item (Poster)
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cpaper_150.pdf - Other
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More information

Published date: June 2008
Additional Information: Event Dates: June 2008
Venue - Dates: IEEE Silicon Nanoelectronics Workshop, Honolulu, 2008-05-31
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266266
URI: http://eprints.soton.ac.uk/id/eprint/266266
PURE UUID: b34b6d1e-7076-4945-b942-85b915e2c69d

Catalogue record

Date deposited: 23 Jul 2008 09:04
Last modified: 20 Nov 2021 08:32

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Contributors

Author: M. Manoharan
Author: Yoshishige Tsuchiya
Author: S. Oda
Author: Hiroshi Mizuta

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