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High-speed and Non-volatile Memory Devices Using a Macroscopic Polarized Stack Consisting of Double Floating Gates Interconnected with Engineered Tunnel Oxide Barriers

High-speed and Non-volatile Memory Devices Using a Macroscopic Polarized Stack Consisting of Double Floating Gates Interconnected with Engineered Tunnel Oxide Barriers
High-speed and Non-volatile Memory Devices Using a Macroscopic Polarized Stack Consisting of Double Floating Gates Interconnected with Engineered Tunnel Oxide Barriers
pp 145-146
Tsuchiya, Yoshishige
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Kurihara, T.
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Saito, D.
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Niikura, H.
ac405060-331d-4709-ac56-610813ad0a51
Mizuta, Hiroshi
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Oda, S.
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Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Kurihara, T.
b49abe9c-f986-4e38-bdf1-ff711b124bb4
Saito, D.
b1d1e867-7257-46f3-a784-3b31d889b749
Niikura, H.
ac405060-331d-4709-ac56-610813ad0a51
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde

Tsuchiya, Yoshishige, Kurihara, T., Saito, D., Niikura, H., Mizuta, Hiroshi and Oda, S. (2007) High-speed and Non-volatile Memory Devices Using a Macroscopic Polarized Stack Consisting of Double Floating Gates Interconnected with Engineered Tunnel Oxide Barriers. IEEE Silicon Nanoelectronics Workshop, Kyoto. pp 145-146 .

Record type: Conference or Workshop Item (Poster)
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More information

Published date: June 2007
Additional Information: Event Dates: June 2007
Venue - Dates: IEEE Silicon Nanoelectronics Workshop, Kyoto, 2007-06-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266282
URI: http://eprints.soton.ac.uk/id/eprint/266282
PURE UUID: dac57496-cc14-42de-9b04-5f659cf14cf6

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Date deposited: 23 Jul 2008 09:43
Last modified: 14 Mar 2024 08:24

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Contributors

Author: Yoshishige Tsuchiya
Author: T. Kurihara
Author: D. Saito
Author: H. Niikura
Author: Hiroshi Mizuta
Author: S. Oda

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