High-speed and Non-volatile Memory Devices Using a Macroscopic Polarized Stack Consisting of Double Floating Gates Interconnected with Engineered Tunnel Oxide Barriers
High-speed and Non-volatile Memory Devices Using a Macroscopic Polarized Stack Consisting of Double Floating Gates Interconnected with Engineered Tunnel Oxide Barriers
pp 145-146
Tsuchiya, Yoshishige
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Kurihara, T.
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Saito, D.
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Niikura, H.
ac405060-331d-4709-ac56-610813ad0a51
Mizuta, Hiroshi
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Oda, S.
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June 2007
Tsuchiya, Yoshishige
5a5178c6-b3a9-4e07-b9b2-9a28e49f1dc2
Kurihara, T.
b49abe9c-f986-4e38-bdf1-ff711b124bb4
Saito, D.
b1d1e867-7257-46f3-a784-3b31d889b749
Niikura, H.
ac405060-331d-4709-ac56-610813ad0a51
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Tsuchiya, Yoshishige, Kurihara, T., Saito, D., Niikura, H., Mizuta, Hiroshi and Oda, S.
(2007)
High-speed and Non-volatile Memory Devices Using a Macroscopic Polarized Stack Consisting of Double Floating Gates Interconnected with Engineered Tunnel Oxide Barriers.
IEEE Silicon Nanoelectronics Workshop, Kyoto.
.
Record type:
Conference or Workshop Item
(Poster)
Text
cpaper_134.pdf
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Published date: June 2007
Additional Information:
Event Dates: June 2007
Venue - Dates:
IEEE Silicon Nanoelectronics Workshop, Kyoto, 2007-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266282
URI: http://eprints.soton.ac.uk/id/eprint/266282
PURE UUID: dac57496-cc14-42de-9b04-5f659cf14cf6
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Date deposited: 23 Jul 2008 09:43
Last modified: 14 Mar 2024 08:24
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Contributors
Author:
Yoshishige Tsuchiya
Author:
T. Kurihara
Author:
D. Saito
Author:
H. Niikura
Author:
Hiroshi Mizuta
Author:
S. Oda
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