Pruvost, B., Mizuta, Hiroshi and Oda, S. (2006) Design and analysis of functional NEMS-gate MOSFETs and SETs. IEEE Silicon Nanoelectronics Workshop, Honolulu. pp 35-36 .
Record type:
Conference or Workshop Item
(Poster)
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Published date: June 2006
Additional Information:
Event Dates: June 2006
Venue - Dates:
IEEE Silicon Nanoelectronics Workshop, Honolulu, 2006-06-01
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 266300
URI: http://eprints.soton.ac.uk/id/eprint/266300
PURE UUID: 2ae6fbe5-e63f-4b52-9798-9dd5546cad4f
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Date deposited: 23 Jul 2008 10:38
Last modified: 14 Mar 2024 08:25
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Contributors
Author:
B. Pruvost
Author:
Hiroshi Mizuta
Author:
S. Oda
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