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Variation of Electrostatic Coupling and Investigation of Current Percolation Paths in Nanocrystalline Silicon Cross Transistors

Variation of Electrostatic Coupling and Investigation of Current Percolation Paths in Nanocrystalline Silicon Cross Transistors
Variation of Electrostatic Coupling and Investigation of Current Percolation Paths in Nanocrystalline Silicon Cross Transistors
Khalafalla, M.
4a320e02-d7bf-4cc0-a5e4-bf818ea565bc
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Durrani, Z. A. K.
18f7df81-696b-4e8c-b365-c783563920c4
Khalafalla, M.
4a320e02-d7bf-4cc0-a5e4-bf818ea565bc
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S.
4a88f225-39f6-4c89-a9da-8c35fbfe6fde
Durrani, Z. A. K.
18f7df81-696b-4e8c-b365-c783563920c4

Khalafalla, M., Mizuta, Hiroshi, Oda, S. and Durrani, Z. A. K. (2005) Variation of Electrostatic Coupling and Investigation of Current Percolation Paths in Nanocrystalline Silicon Cross Transistors. International Conference on Nanoelectronics, Nanostructures and Carrier Interactions.

Record type: Conference or Workshop Item (Other)
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More information

Published date: January 2005
Additional Information: Event Dates: January 2005
Venue - Dates: International Conference on Nanoelectronics, Nanostructures and Carrier Interactions, 2005-01-01
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266320
URI: https://eprints.soton.ac.uk/id/eprint/266320
PURE UUID: 8ba6c858-d29b-4ab5-9a91-08244e8821eb

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Date deposited: 23 Jul 2008 11:30
Last modified: 18 Jul 2017 07:17

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