Ingelsson, Urban, Al-Hashimi, Bashir M. and Harrod, Peter
Variation Aware Analysis of Bridging Fault Testing
At 17th Asian Test Symposium, Japan.
24 - 27 Nov 2008.
- Accepted Manuscript
This paper investigates the impact of process variation on test quality with regard to resistive bridging faults. The input logic threshold voltage and gate drive strength parameters are analyzed regarding their process variation induced influence on test quality. The impact of process variation on test quality is studied in terms of test escapes and measured by a robustness metric. It is shown that some bridges are sensitive to process variation in terms of logic behavior, but such variation does not necessarily compromise test quality if the test has high robustness. Experimental results of Monte-Carlo simulation based on recent process variation statistics are presented for ISCAS85 and -89 benchmark circuits, using a 45nm gate library and realistic bridges. The results show that tests generated without consideration of process variation are inadequate in terms of test quality, particularly for small test sets. On the other hand, larger test sets detect more of the logic faults introduced by process variation and have higher test quality.
Conference or Workshop Item
||Event Dates: 24-27 Nov 2008
|Venue - Dates:
||17th Asian Test Symposium, Japan, 2008-11-24 - 2008-11-27
||Resistive Bridging Faults, Process Variation, Test Quality, Probability, Static Voltage Testing
||Electronic & Software Systems
|24 November 2008||Published|
||30 Jul 2008 15:13
||17 Apr 2017 19:03
|Further Information:||Google Scholar|
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