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Yield Model Characterization for Analogue Integrated Circuit Using Pareto-Optimal Surface

Ali, Sawal, Wilcock, Reuben, Wilson, Peter and Brown, Andrew (2008) Yield Model Characterization for Analogue Integrated Circuit Using Pareto-Optimal Surface At CDNLive 2008, Germany.

Record type: Conference or Workshop Item (Other)
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Published date: April 2008
Additional Information: Event Dates: 28 April 2008
Venue - Dates: CDNLive 2008, Germany, 2008-04-28
Organisations: EEE

Identifiers

Local EPrints ID: 266473
URI: http://eprints.soton.ac.uk/id/eprint/266473
PURE UUID: 9717b6b1-70da-4736-84fb-78e80442cfcd

Catalogue record

Date deposited: 01 Aug 2008 11:27
Last modified: 18 Jul 2017 07:16

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Contributors

Author: Sawal Ali
Author: Reuben Wilcock
Author: Peter Wilson
Author: Andrew Brown

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