Test Strategies for Multi-Voltage Designs
Test Strategies for Multi-Voltage Designs
Reducing the power consumption of digital designs through the use of more than one Vdd value (Multi-Voltage) is known and well practiced. Some manufacturing defects have Vdd-dependency, which implies defects can become active only at certain power supply setting, leading to reduced defect coverage. This chapter presents a coherent overview of recently reported research in testing strategies for multi-voltage designs including defect modelling, test generation and DFT solutions. The chapter also outlines number of worthy research problems that need to be addressed to develop high quality and cost effective test solutions for multi-Vdd designs.
Khursheed, Syed Saqib
df76c622-61ca-45b2-b067-2753f1ac0abf
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
November 2009
Khursheed, Syed Saqib
df76c622-61ca-45b2-b067-2753f1ac0abf
Al-Hashimi, Bashir
0b29c671-a6d2-459c-af68-c4614dce3b5d
Khursheed, Syed Saqib and Al-Hashimi, Bashir
(2009)
Test Strategies for Multi-Voltage Designs.
In,
Girard, Patrick, Nicolici, Nicola and Wen, Xiaoqing
(eds.)
Power-Aware Testing and Test Strategies for Low Power Devices.
Springer.
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Book Section
Abstract
Reducing the power consumption of digital designs through the use of more than one Vdd value (Multi-Voltage) is known and well practiced. Some manufacturing defects have Vdd-dependency, which implies defects can become active only at certain power supply setting, leading to reduced defect coverage. This chapter presents a coherent overview of recently reported research in testing strategies for multi-voltage designs including defect modelling, test generation and DFT solutions. The chapter also outlines number of worthy research problems that need to be addressed to develop high quality and cost effective test solutions for multi-Vdd designs.
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Chapter_8.pdf
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More information
Published date: November 2009
Additional Information:
Chapter: 8
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 267331
URI: http://eprints.soton.ac.uk/id/eprint/267331
PURE UUID: 6ffea9aa-2979-46c6-af10-5180ce978f58
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Date deposited: 05 May 2009 18:49
Last modified: 14 Mar 2024 08:48
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Contributors
Author:
Syed Saqib Khursheed
Author:
Bashir Al-Hashimi
Editor:
Patrick Girard
Editor:
Nicola Nicolici
Editor:
Xiaoqing Wen
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