Current oscillations observed for sparse Si nanocrystal thin films
Current oscillations observed for sparse Si nanocrystal thin films
Zhou, X
4ef9e49f-f25d-4b39-b1d5-ea5a49d5ad64
Uchida, K
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Mizuta, Hiroshi
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Oda, S
514339b3-f8de-4750-8d20-c520834b2477
13 June 2009
Zhou, X
4ef9e49f-f25d-4b39-b1d5-ea5a49d5ad64
Uchida, K
94591838-45bd-426b-91da-f9d60a055c6c
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S
514339b3-f8de-4750-8d20-c520834b2477
Zhou, X, Uchida, K, Mizuta, Hiroshi and Oda, S
(2009)
Current oscillations observed for sparse Si nanocrystal thin films.
IEEE Silicon Nanoelectronics Workshop 2009, Kyoto.
13 - 14 Jun 2009.
Record type:
Conference or Workshop Item
(Poster)
Text
Zhou2_SNW09.pdf
- Other
More information
Published date: 13 June 2009
Additional Information:
Event Dates: 13-14 June 2009
Venue - Dates:
IEEE Silicon Nanoelectronics Workshop 2009, Kyoto, 2009-06-13 - 2009-06-14
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 267370
URI: http://eprints.soton.ac.uk/id/eprint/267370
PURE UUID: c3f95053-6b2d-402f-85e2-2eae15635915
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Date deposited: 14 May 2009 16:14
Last modified: 14 Mar 2024 08:49
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Contributors
Author:
X Zhou
Author:
K Uchida
Author:
Hiroshi Mizuta
Author:
S Oda
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