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Modeling of Surface Charge Decay in a Spherical Cavity within a Solid Dielectric Material using Finite Element Analysis

Modeling of Surface Charge Decay in a Spherical Cavity within a Solid Dielectric Material using Finite Element Analysis
Modeling of Surface Charge Decay in a Spherical Cavity within a Solid Dielectric Material using Finite Element Analysis
The modelling of cavity surface charge decay through conduction along the cavity wall using the Finite Element Analysis (FEA) method is presented in this paper. A field-dependent cavity surface conductivity is proposed and the Phase-Resolved Partial Discharge (PRPD) patterns obtained from experimental measurements used to validate the simulation results generated using the model. A comparison between the simulation and measurement results has also been undertaken to verify the surface charge decay effect.
978-0-620-44585-6
1246-1251
Illias, H
b40d9b5c-c24f-4d80-99ad-a15b1d7e029c
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Illias, H
b40d9b5c-c24f-4d80-99ad-a15b1d7e029c
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e

Illias, H, Chen, G and Lewin, P L (2009) Modeling of Surface Charge Decay in a Spherical Cavity within a Solid Dielectric Material using Finite Element Analysis. 16th International Symposium on High Voltage Engineering, South Africa. 24 - 28 Aug 2009. pp. 1246-1251 .

Record type: Conference or Workshop Item (Paper)

Abstract

The modelling of cavity surface charge decay through conduction along the cavity wall using the Finite Element Analysis (FEA) method is presented in this paper. A field-dependent cavity surface conductivity is proposed and the Phase-Resolved Partial Discharge (PRPD) patterns obtained from experimental measurements used to validate the simulation results generated using the model. A comparison between the simulation and measurement results has also been undertaken to verify the surface charge decay effect.

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More information

Published date: 24 August 2009
Additional Information: Event Dates: 24-28 August 2009
Venue - Dates: 16th International Symposium on High Voltage Engineering, South Africa, 2009-08-24 - 2009-08-28
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 267820
URI: https://eprints.soton.ac.uk/id/eprint/267820
ISBN: 978-0-620-44585-6
PURE UUID: 89617077-ad45-40c8-944c-061e4ed39897

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Date deposited: 02 Sep 2009 15:01
Last modified: 18 Jul 2017 06:59

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Contributors

Author: H Illias
Author: G Chen
Author: P L Lewin

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